comparano
Infrared Ellipsometry on Semiconductor Layer Structures

Infrared Ellipsometry on Semiconductor Layer Structures

Springer Berlin Heidelberg·EAN 9783540232490

Best price from 1 offer

€246.09

Go to Springer Nature →

Compare 1 price

StorePriceAction

Springer Nature

link.springer.com

Best price

In stock

€246.09Go → Go to store →

Price alert

We'll email you when the price drops below your target.

By clicking Notify me you agree to receive one confirmation email and one price notification for this product. You can unsubscribe at any time.

Price history — lowest price

€246.09

Lowest daily price across all stores · avg over this period: €246.09

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

Comparano compares prices for Infrared Ellipsometry on Semiconductor Layer Structures across 1 online store. The best price today is €246.09. Over the last 90 days the lowest daily price averaged €246.09. Prices are updated several times a day; the final price is confirmed in the store.

More from Springer Berlin Heidelberg